Browse by Journal Title

Article

Protein crystallization with and without precipitants.
Behlke, J. and Marg, A. and Paeschke, M.
Journal of Applied Crystallography 30 (5/1): 559-560. 1 October 1997

Probabilistic evaluation of similarity between pairs of three-dimensional protein structures utilizing temperature factors.
Carugo, O. and Eisenhaber, F.
Journal of Applied Crystallography 30 (5/1): 547-549. 1 October 1997

The use of small-angle scattering and the maximum-entropy method for shape-model determination from distance-distribution functions.
Mueller, J.J. and Hansen, S. and Puerschel, H.V.
Journal of Applied Crystallography 29 (Pt 5): 547-554. 1 October 1996

Glass-capillary collimator for distance compensation and partial monochromatization at rotating-anode X-ray generators.
Mueller, J.J. and Gorny, H.E. and Schmalz, J. and Heinemann, U.
Journal of Applied Crystallography 28 (Pt 6): 853-855. 1 December 1995

Multimodal particle size distribution or fractal surface of acrylic acid copolymer nanoparticles: A small-angle X-ray scattering study using direct Fourier and indirect maximum entropy methods.
Mueller, J.J. and Hansen, S. and Lukowski, G. and Gast, K.
Journal of Applied Crystallography 28 (Pt 6): 774-781. 1 December 1995

AKIMA interpolation: A tool used in direct slit-length desmearing procedures of non-frequency- limited X-ray scattering curves.
Mueller, J.J. and Mueller, E.C. and Gernat, C. and Kroeber, R.
Journal of Applied Crystallography 28 (Pt 1): 38-42. 1 February 1995

A study of high-resolution x-ray scattering data evaluation by the maximum-entropy method.
Mueller, J.J. and Hansen, S.
Journal of Applied Crystallography 27 (Pt 3): 257-270. 1 June 1994

The database BIOSCAT: a tool for structure research by scattering and hydrodynamic methods.
Mueller, J.J. and Pankow, H. and Poppe, B. and Damaschun, G.
Journal of Applied Crystallography 25 (Pt 6): 803-806. 1 December 1992

The inertia-equivalent ellipsoid: a link between atomic structure and low-resolution models of small globular proteins determined by small-angle x-ray scattering.
Mueller, J.J. and Schrauber, H.
Journal of Applied Crystallography 25 (Pt 2): 181-191. 1 April 1992

Review

XDSAPP2.0.
Sparta, K.M. and Krug, M. and Heinemann, U. and Mueller, U. and Weiss, M.S.
Journal of Applied Crystallography 49 (3): 1085-1092. June 2016

XDSAPP: a graphical user interface for the convenient processing of diffraction data using XDS.
Krug, M. and Weiss, M.S. and Heinemann, U. and Mueller, U.
Journal of Applied Crystallography 45 (3): 568-572. June 2012