Gentle ions for cryo-FIB milling

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Item Type:	Editorial
Title:	Gentle ions for cryo-FIB milling
Creators Name:	Chu, X. and Kudryashev, M.
Abstract:	Cryo-EM imaging of vitreous samples is limited to a few hundred nanometers in thickness. Focused ion beams can mill windows into cells and tissues for imaging, but they damage biological samples. In this issue of Structure, Yang et al. (2023) quantitatively describe this damage and suggest ways to minimize it.
Keywords:	Cryoelectron Microscopy, Electron Microscope Tomography, Ions, Transmission Electron Microscopy
Source:	Structure
ISSN:	0969-2126
Publisher:	Cell Press
Volume:	31
Number:	10
Page Range:	1147-1148
Date:	5 October 2023
Official Publication:	https://doi.org/10.1016/j.str.2023.09.003
PubMed:	View item in PubMed

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