New techniques in surface specific mass analysis by photon induced field desorption

Item Type:	Article
Title:	New techniques in surface specific mass analysis by photon induced field desorption
Creators Name:	Drachsel, W. and Jentsch, T.J. and Block, J.H.
Abstract:	Laserphoton induced field desorption combined with TOF-measurements and the atomprobe technique provides a powerful method to analyze specific surface areas under high field conditions. Derived from photon induced field ionization mass spectrometry, this method allows simultaneous FIM imaging and surface specific mass analysis in the course of which emitter temperature and/or voltage can be programmed.
Source:	International Journal of Mass Spectrometry and Ion Physics
ISSN:	0168-1176
Publisher:	Elsevier
Volume:	46
Page Range:	293-296
Date:	January 1983
Official Publication:	https://doi.org/10.1016/0020-7381(83)80110-7

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